ZEISS EVO MA15 SEM. The ZEISS EVO SEM is beneficial to a wide range of users and are equipped with the following detectors: Secondary Electron Detector (SED), Backscattered Electron Detector (BSD), Energy Dispersive X-ray Spectrometer (EDS), Wave Dispersive X-ray Spectrometer (WDS) for more quantitative, in- situ elemental analysis.

The sample targets can be almost any type of solid material shaving resistance to the incident electron beam (<30kV). Common examples include metal, rock, soil, glass, plastic, polymer, fibre, ceramic, concrete, biological entities, or any combination of these. This capability allows users to perform SE/BSD imaging and EDS/WDS analysis with least chemical composition of the specimen. Other functionalities of this SEM instrument include montage, phase mapping and feature analyses.