Electron Microscopy (EM) Unit

Electron Microscopy (EM) is an advanced imaging technique that uses a focused beam of electrons to scan the surface of a sample, producing high-resolution images and detailed surface information. The CAF Electron Microscopy Unit offers a wide range of services and techniques across both material and biological sciences. These include standard SEM imaging, as well as advanced methods such as Scanning Transmission Electron Microscopy (STEM), which allows for high-resolution imaging of nanoparticles (metallic, biological, microbial, etc.) and thin sections, producing TEM-like images. The unit is also equipped for Energy Dispersive Spectroscopy (EDS) and Wavelength Dispersive Spectroscopy (WDS), enabling elemental and compositional analysis. Additionally, they offer Cathodoluminescence (CL) Microscopy, a technique that provides nanoscale insights into a material’s optical properties, structural defects, and composition. Notably, this facility houses the only Volume Electron Microscopy system on the African continent, featuring Serial Block-Face SEM (SBF-SEM) for 3D volumetric imaging of biological samples at nanoscale resolution. Furthermore, the unit offers variable pressure SEM, which allows for imaging of samples in their natural, uncoated state—ideal for sensitive or non-conductive materials.